Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Resistive & Capacitive, Inductive AC Load Bank
RLC
Inductive & capacitive load banks are reactive only and must be used in combination with a resistive load bank to provide the desired load profile to test a power system. Reactive loads banks can provide either a leading power factor (Capacitive) or lagging power factor (Inductive).
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PXI 5W Programmable Resistor Module, 1-Channel, 2.5Ω to 1.51MΩ
40-252-044
The 40-252-044 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 1.51MΩ with 2Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 2.5W Programmable Resistor Module, 2-Channel, 3Ω to 11.4MΩ
40-251-053
The 40-251-053 is a programmable resistor module with 2 channels which can be set between 3Ω and 11.4MΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, MCX
40-878-212
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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High Efficiency, Low-Cost Test for Less Complex Signal Devices
J750Ex-HD Family
Microcontroller Units (MCUs) are used in automobiles, mobile electronics and robotics. As you go through your day, dozens of MCUs are in your electronic devices working to provide unique features and Teradyne’s J750 family most likely tested them. With a growing installed base of over 6,000 test systems and widely available at more than 50 Outsourced Assembly and Test (OSAT) locations, Teradyne’s J750 is the industry standard for high volume test of low-cost devices.
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OpenBenchmarking.org
OpenBenchmarking.org is an open, collaborative testing platform. The OpenBenchmarking.org infrastructure provides public and private storage of test result data (including system logs) and effective collaboration tools for sharing results and efficiently comparing multiple test result sets. OpenBenchmarking.org also provides a package management system for making accessible new, updated, and third-party test profiles / suites to the users of the Phoronix Test Suite.
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E-mobility Test Systems
Correct contactingcharging cable detectionsecurity questionExtensive range of accessories for on-site measurements in a separate caseCharging cable with additional measuring lines (Sense)Convenient control through guided test procedure via WinSAM and tabletElectromechanical locking
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Variable Frequency AC Resonant Test System
HDXZ-270kVA/270kV
HD Power Test Equipment Co.ltd
HDXZ-270kVA/270kV Variable Frequency AC Resonant Test System is applied for AC dielectric test for electric equipment.1. 10kV/300mm2 cable 3km AC withstand test,capacitance≤1.1265uF,test frequency:30-300Hz, test voltage 22kV, test time 5min;2. 35kV/300mm2 cable 1km AC withstand test,capacitance≤0.1945uF,test frequency:30-300Hz, test voltage 52kV, test time 60min;3. 110kV/630mm2 cable 0.2km AC withstand test,capacitance≤0.0368uF,test frequency:30-300Hz, test voltage 128kV, test time 60min;4. ...show more -
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PXI High Density Precision Resistor Module, 6-Channel, 4Ω to 22.3MΩ
40-298-054
The 40-298-054 is a high density programmable resistor module with 6 channels which can be set between 4Ω and 22.3MΩ with 2Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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MIL-STD-1553 MCH
M4K1553MCH
The M4K1553MCH interface module for the multimode, multiprotocol, Excalibur 4000 family of carrier boards provide a complete solution for developing and testing 1553 interfaces and performing system simulation of the MIL-STD-1553 bus. The module handles all standard variations of the MIL-STD-1553 protocol.The M4K1553MCH contains 32k x 16 of dual-port RAM for Data blocks, Control registers, and Look-up tables. All Data blocks and Control registers are memorymapped and may be accessed in real time...show more -
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CD/DVD Analyzer
Shuttleplex
The ShuttlePlex CDVD Analyzer can be configured to automatically test, save, report, grade, print and export your optical disc data. The unit is designed to provide an efficient, effective, low cost analysis for just about any optical disc production process. The User interface provides a feature set and graphical environment (See Below) similar to those used by Professional Engineers in a Disc Manufacturing Environment. The Unit was designed with Duplicators, Web Disc, Game Designers, Media Distributors and Archivalists in mind. The ShuttlePlex can be purchased in Several configurations; as a stand alone unit, external laptop drive or integrated into a PC based duplication system.
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Integrating Sphere Spectroradiometer System for LED
LPCE-2(LMS-8000)
LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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Ionic Contamination Test Systems
CM+ Series
The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric i...show more -
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Torque Measuring and Monitoring System
WISER 4000
TECAT Performance Systems, LLC
The WISER 4000 system is the latest release of TECAT’s low-cost, ultra-low power and extremely accurate torque sensor. The wireless system has the optional ability to measure 3-axis acceleration, barometric pressure and ambient temperature, all within the same incredibly small footprint. The 4000 includes on-board data logging without PC or DAQ connectivity, and remote flash capability, which enables firmware upgrades without removing the system from the unit under test. Featuring shunt calibrat...show more -
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and int...show more -
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Semi-automatic Measuring And Alignment System
McBain Z-NIR Near Infrared Inspection Microscope
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Portable, Integrated O-Level Test Platform
Guardian™
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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6-12V Heavy Duty Circuit Tester
1649
Peaceful Thriving Enterprise Co Ltd
Check on 6 and 12V systems. Quickly and safely tests high and low voltages on all vehicle voltages, including computerized engine.
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Single column automated force test stand up to 500 pounds
701SN
The advanced 701 Universal Test System is ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials or products up to 500 pounds.This variable speed tester has increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.
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DC Hi-Pot Tester
3010HP, 3025HP & 3050HP
The DC Hi-Pot test is an important part and parcel of the electrical safety tests mandated by standards organization world-wide. More than 80 per cent of faults in electrical and electronic systems are due to weak insulation caused by environmental factors such as dirt, grease, temperature stress, humidity, etc that affect the dielectric strength of the insulation material.
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Transformer Testing
The ART-3D series of Automatic Ratio Testers are precision instruments, designed to measure the turn ratios, phase displacements, excitation currents of single phase and three phase power, distribution and instrument transformers in conformity to the IEEE C57.12.90 & IEC 60076. Now featuring an enhanced test lead design, the ART-3D is the perfect instrument for real-life field usage. ART-3D series also has Anti Induction circuit which makes it suitable for system voltages upto 765KV.
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PXI Precision Resistor Module 9-Channel, 2 to 13.6k
40-297-031
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Vertical Shock/Bump Tester (Pneumatic)
HIACC Engineering & Services Pvt. Ltd.
The pneumatic vertical shock and bump test system features an advanced design with a high degree of performance and automation. The testes is easy to use and have low maintenance requirements.
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HEV & EV Power Tester
EVd-40
The EVd-40 Power Tester is a pre- and post-reconditioning tool for quality control of aftermarket HEV & EV battery production. The equipment integrates a “smart” charger (Sorensen XG 1700 or Kepco KLN 1500W) with NuVant Systems high power discharge electronics. The "power test" discharges battery packs at high power (10,000 watts), while tracking module voltages. The software monitors up to 40 module voltages at a time, identifying any weak modules. The "smart" charger performs charging cons...show more -
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High Temperature Furnace COD Gages (1200 C or 1600 C)
Model 3548COD
Jinan Testing Equipment IE Corporation
These COD gages mount on a water-cooled bracket, which is mounted on the furnace side cut-out or with optional load frame support brackets. The standard temperature version (to 1200℃) is supplied with high purity alumina rods. The high temperature option is furnished with alpha grade silicon carbide rods. Rods are made to order to the length required for your furnace. Mounting brackets may be integrated with the furnace cut-out. Epsilon can also provide optional load frame mounting brackets to f...show more -
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FPGA PXIe High-Performance Digital I/O Card
GX3700e
The GX3700e is a user configurable, FPGA–based, 3U PXI Express card offering 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3700e is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design th...show more -
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Process & Material Characterization System
TriboLab CMP
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Pump, Hydrostatic Test, 15,000 psi
9901-150L
Hydrostatic test pump may be utilized as a standalone unit or combined with any of our reservoirs, safety test chambers, test fittings or other optional equipment to achieve a complete hydrostatic test system. with integral safety test chamber.
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Test Samples
Performance testing of metal detection equipment is a crucial part of a food safety and quality management system. Confirming the correct performance of your detector at regular intervals ensures your system is compliant with programs like FSMA, SQF, GFS, BRC and other relevant auditing schemes.
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EST-200 Emission Safety Test System For Toys
Hangzhou Everfine Photo-E-Info Co., LTD
The system can test the radiation intensity, irradiance, light color expansion angle, peak wavelength, dominant wavelength, bandwidth, etc. of various toy light emitting devices. The measurement conditions meet the CIE127 standard, and the test report meets the ENIEC62115:2020 standa
